Electronic Structure Analyses by X-ray Emission Spectroscopy Based on Transmission Electron Microscopy
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Nihon Kessho Gakkaishi
سال: 2005
ISSN: 0369-4585,1884-5576
DOI: 10.5940/jcrsj.47.79